مرکز منطقه ای اطلاع رساني علوم و فناوري - Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints

Title of article :

Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints

Author/Authors :

Dit-Yan Yeung، نويسنده , , n Hong Chang، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2006

Pages :

From page :

1007

To page :

1010

Keywords :

Metric learning , Mahalanobis metric , Semi-supervised learning

Journal title :

PATTERN RECOGNITION

Serial Year :

2006

Journal title :

PATTERN RECOGNITION

Record number :

210310

Link To Document :