Title of article
Impedance spectroscopy analysis of Bi0.85Pr0.15Fe0.9Co0.1O3 thin films
Author/Authors
Lin، نويسنده , , Ying and Yang، نويسنده , , Haibo and Liu، نويسنده , , Miao and Zhang، نويسنده , , Ge، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2014
Pages
5
From page
44
To page
48
Abstract
Bi0.85Pr0.15Fe0.9Co0.1O3 (BPFCO) thin films were deposited on Pt(1 1 1)/TiO2/SiO2/Si(1 0 0) substrates, with SrRuO3 as buffer layer, by radio frequency magnetron sputtering. Oxygen-vacancies-related dielectric relaxation and scaling behaviors of Bi0.85Pr0.15Fe0.9Co0.1O3 (BPFCO) thin films have been investigated by temperature-dependent impedance spectroscopy. It can be confirmed that it is the high density of oxygen vacancy that causes the occurrence of the double loop hysteresis. The physical nature of relaxation process corresponding to oxygen vacancies was also discussed.
Keywords
D. Electrical properties , A. Thin film , B. Sputtering , C. Impedance spectroscopy
Journal title
Materials Research Bulletin
Serial Year
2014
Journal title
Materials Research Bulletin
Record number
2104941
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