Title of article :
Crystal growth, structure, and dielectric properties of layered cobaltates La2−xSrxCoO4 (x = 0.4, 0.5, and 0.6) single crystal
Author/Authors :
Dong، نويسنده , , S.T. and Sun، نويسنده , , N. and Zhang، نويسنده , , B.B. and Zhang، نويسنده , , F. and Yao، نويسنده , , S.H. and Zhou، نويسنده , , J. and Zhang، نويسنده , , S.T. and Gu، نويسنده , , Z.B. and Chen، نويسنده , , Y.B. and Chen، نويسنده , , Y.F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2015
Pages :
5
From page :
352
To page :
356
Abstract :
In this work, La2−xSrxCoO4 (x = 0.4, 0.5, and 0.6) crystals with the Ruddlesden–Popper K2NiF4-type structure have been grown by the floating zone method. This compound crystallizes in the K2NiF4-type structure with space group I4/mmm. Temperature-dependent dielectric properties of the as-grown crystals were studied over a broad frequency range. The origin of the giant dielectric constant in this system is the mixed-valence structure between Co2+ and Co3+, and the dielectric constant at high frequency is related to the charge ordering structure. The dielectric relaxation shows a thermally-activated behavior. The corresponding activation energy (assigned to small polaronic hopping) can be obtained by Arrhenius fitting.
Keywords :
A. Layered compounds , B. Crystal growth , D. Dielectric properties , C. Raman spectroscopy
Journal title :
Materials Research Bulletin
Serial Year :
2015
Journal title :
Materials Research Bulletin
Record number :
2105989
Link To Document :
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