Title of article
Diffusion of cadmium in lead telluride
Author/Authors
Bobruiko، نويسنده , , V.B. and Kouznetzova، نويسنده , , T.A. and Belyansky، نويسنده , , M.P. and Gaskov، نويسنده , , A.M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
4
From page
7
To page
10
Abstract
In order to determine the diffusion coefficient of cadmium in lead telluride DCd, CdTe/PbTe heterostructures were prepared by hot wall epitaxy. To obtain the cadmium concentration profile, quantitative Auger electron spectroscopy (AES) and sputtered-neutral mass spectroscopy (SNMS) were used. The data on the cadmium depth profile were used for evaluation of the dependence of DCd on temperature at low temperatures (350–450°C) in heterostructures. The data obtained for DCd vs. temperature are close to those calculated using the equation known for higher temperatures.
Keywords
Auger electron spectroscopy , Cadmium , diffusion , Lead telluride
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1995
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2131071
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