• Title of article

    Gas permeabilities in thermally grown silicon dioxide films

  • Author/Authors

    Li، نويسنده , , Yong-Long and Pinto، نويسنده , , Neville G. and Thurmon Henderson، نويسنده , , H. and Hwang، نويسنده , , Sun-Tak and Nguyen، نويسنده , , Phu، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1995
  • Pages
    6
  • From page
    63
  • To page
    68
  • Abstract
    The permeability characteristics of six gases, argon, helium, oxygen, nitrogen, carbon dioxide and hydrogen, in thermally grown silicon dioxide films have been evaluated. By studying the dependence of permeabilities on temperature, pressure and molecular weigth, it has been established that the controlling mechanism of transport is viscous flow through micropores. This implies, contrary to what is commonly assumed, that gas permeabilities in thermally grown silicon dioxide films decreases with an increase in temperature, and suggests that annealing temperatures should be low for favorable gas fluxes.
  • Keywords
    Silicon oxide , diffusion , Oxygen , Thin films
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    1995
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2131091