Title of article :
Oxygen related defects in germanium
Author/Authors :
Clauws، نويسنده , , P.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
8
From page :
213
To page :
220
Abstract :
Spectroscopic investigations during the last decade have resulted in a detailed picture of oxygen related defects in germanium such as oxygen interstitials and thermal donors. The results are summarized and compared with those of equivalent centres in silicon. The many similarities suggest that unified models for the major oxygen defects in the two semiconductors may apply.
Keywords :
Silicon , Germanium , infrared spectroscopy , Oxygen
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1996
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2131389
Link To Document :
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