Title of article
Conductance simulation through single atom junctions at the scanning tunnelling microscope
Author/Authors
Jurczyszyn، نويسنده , , L. and Mingo، نويسنده , , N. and Flores، نويسنده , , F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
3
From page
93
To page
95
Abstract
Using a Keldish-Green Function formalism we simulate the current flowing through transition and noble metal atoms wires. Such a kind of wire is nowadays experimentally studied with several methods involving mechanically controllable break junction or a scanning tunnelling microscope operating in close contact regime. Our aim is to reproduce the experimental differences found between several materials. Results for Pt, Ni and Au and their comparison with the experiments are discussed.
Keywords
conductance , Tunelling
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1996
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2131420
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