Title of article :
STM-based luminescence spectroscopy on single quantum dots
Author/Authors :
Pistol، نويسنده , , Ola Hessman، نويسنده , , Yunus D. and Lindahl، نويسنده , , J. and Montelius، نويسنده , , L. and Samuelson، نويسنده , , L.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
6
From page :
82
To page :
87
Abstract :
The ability to fabricate quantum dots using the Stranski-Krastanow growth technique has improved dramatically during the last number of years. Due to the large number of dots formed (typically 108–109 cm−3) the emission linewidth is inhomogeneously broadened. We have grown quantum dots of InP in between barriers of GaInP, as well as on top of GaInP, having a low density of dots in order to perform single-dot spectroscopy. These dots have been studied by photoluminescence and scanning tunneling luminescence. We find in photoluminescence that the fully formed dots have well-defined, sharp (0.04–1 meV) emission lines, which are very similar from dot to dot. In scanning tunneling luminescence we find that we can very locally excite only a few partially formed dots which have sharp emission lines (0.1 meV at 77 K). These emission lines display a quantum confined Stark effect when the applied tip to sample bias is varied. We can carefully determine the onset of exciton formation as a function of applied bias. The applied bias which is necessary for impact ionization is found to agree well with simple theory.
Keywords :
Scanning tunneling microscopy , Quantum dots , Semiconductors
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1996
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2131872
Link To Document :
بازگشت