Title of article :
Critical issues of III–V compound semiconductor processing
Author/Authors :
Pearton، نويسنده , , S.J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
7
From page :
1
To page :
7
Abstract :
We review some of the key processing needs for fabrication of next-generation electronic and photonic devices from III–V semiconducctors. These include high rate plasma etching capable of smooth controlled pattern transfer, selective wet etching solutions for the InGaAlP and InGaAlN materials systems and improved ohmic and rectifying contacts. The achievement of high reliability and acceptable yields requires low thermal budgets and an absence of residual damage from deposition, etch or implant processes.
Keywords :
Exothermal , Ion density , Wet etching
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1997
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2132107
Link To Document :
بازگشت