Scanning probe microscopy of GaAs/AlGaAs superlattices

A GaAs/AlGaAs superlattice is investigated by means of scanning probe microscopy (SPM). The periodic structure is very well distinguished at the edge of a cleaved sample by scanning tunnelling and atomic force microscopy (AFM) techniques in air. Images resulting from different SPM operation modes are compared. Spatial Fourier-transform analysis is applied to determine the period of the superlattice. The results are in good agreement with those obtained by other methods.