Title of article
HgCdTe extended defects electrical activity characterization by variable magnetic field hall measurements
Author/Authors
Berchenko، نويسنده , , N.N. and Kurbanov، نويسنده , , K.R. and Nikiforov، نويسنده , , A.Yu. and Korovin، نويسنده , , A.V.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
4
From page
274
To page
277
Abstract
It has been demonstrated that variable magnetic field Hall measurements for n-Hg1 − xCdxTe samples in intrinsic and extrinsic conductivity regions enable the semiquantitative identification and characterization of extended defects of two topological arrangements with either connected or isolated conducting inclusions.
Keywords
Electrical characterization , Hall effect , Magnetic field
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1997
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2132244
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