Title of article :
Average and local structures of amorphous Pd75Si25 alloy analyzed by modern electron diffraction techniques
Author/Authors :
Hirotsu، نويسنده , , Yoshihiko and Matsushita، نويسنده , , Mitsuhide and Ohkubo، نويسنده , , Tadakatsu and Makino، نويسنده , , Akihiro and Oikawa، نويسنده , , Tetsuo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
6
From page :
274
To page :
279
Abstract :
In order to develop electron diffraction structure analysis methods for both average and local structures of amorphous alloys, halo-electron diffraction intensity and nano-probe electron diffraction intensity analyses were performed for amorphous Pd75Si25 alloy thin firms. In the halo-diffraction intensity analysis, intensities were recorded using ‘imaging plates’ and inelastic intensities were removed by using an energy-filter. Atomic Pd-Pd and Pd-Si distances and the number of Pd-Pd nearest neighbors were determined from the atomic pair distribution function analysis (PDF). To analyze local structure, especially medium-range order (MRO), nano-probe electron diffraction with a probe size of 1–1.5 nm was applied with the help of high-resolution electron microscopy (HREM) observation. It was found that the structure of MRO is hexagonal of the Pd2Si-type with lattice parameters = 0.715 and c = 0.312 nm. Atomic distances of Pd-Pd and Pd-Si and the number of Pd-Pd nearest neighbors obtained from the nano-diffraction structure analysis were in good agreement with those from the PDF analysis.
Keywords :
Atomic medium-range order , energy filtering , High-resolution electron microscopy , Nano-diffraction , Imaging plate , Pair distribution function
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
1997
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2132690
Link To Document :
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