Title of article :
Characterisation of InGaAs/InP microscopic Hall probe arrays with a 2DEG active layer
Author/Authors :
Cambel، نويسنده , , Michaela Gregusova، نويسنده , , D and Eli??، نويسنده , , S. Hasenohrl، نويسنده , , S and Olejn??kov?، نويسنده , , B and Nov?k، نويسنده , , R. F. M. Schapers، نويسنده , , T and Neurohr، نويسنده , , K and Fox، نويسنده , , A، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
4
From page :
188
To page :
191
Abstract :
Highly-sensitive cryogenic microscopic Hall probe arrays based on an epitaxial InGaAs/InP heterostructure with a two-dimensional electron gas (2DEG) were prepared and characterised in high magnetic fields at 0.3 K. A model of the heterostructure including a self-consistent description of coupled Poisson and Schrödinger equations was solved to optimise its design. Test arrays exhibit a constant 2DEG concentration at 4.2–100 K, which gives a temperature coefficient lower than 100 ppm °C−1. The magnetic sensitivity is ≥1250 VA−1T−1. Quantum oscillations in the 2DEG structure in high magnetic fields at temperatures below 4.2 K can be suppressed by increasing bias current supplied to the arrays respecting their dimensions. Noise characteristics at 300 K are also presented.
Keywords :
quantum Hall effect , Semiconductor heterostructure , Hall probe arrays , Alloy scattering
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1998
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2133019
Link To Document :
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