Title of article
Microhardness of thin molybdenum films
Author/Authors
Navr?til، نويسنده , , Vladislav and ?ikola، نويسنده , , Tom??، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
3
From page
390
To page
392
Abstract
The microhardness of thin molybdenum films deposited on monocrystalline Si substrates was measured using a simple method of the extrapolation to a very thick layer. The results obtained give a relatively high value for the film hardness. We attempt to explain this by structural changes which occur in the course of the complicated growth of the films.
Keywords
Thin films , mechanical properties , Microhardness
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
1997
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2133079
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