Title of article
Self-organization as a means to suppress and control defect formation in silicon
Author/Authors
Gubenko، نويسنده , , Anatolii Ya.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
4
From page
100
To page
103
Abstract
It was established that in any phase changes in Si (realized by self-organization), there arises an oscillating sequence of specific microstates. Along ascending and descending branches of the oscillations, the concentrations of thermal donors (TDs) and other defects change in the opposite directions with changes in the parameters of state. This feature of self-organization makes it possible to obtain silicon with low densities of defects.
Keywords
Defects , Experiment , self-organization , Silicon
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1999
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2133761
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