Title of article
Grazing-incidence small-angle and wide-angle scattering of synchrotron radiation on nanosized CeO2 thin films
Author/Authors
Turkovi?، نويسنده , , Aleksandra and Dub?ek، نويسنده , , Pavo and Bernstorff، نويسنده , , Sigrid، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
7
From page
263
To page
269
Abstract
Nanosized CeO2 films on glass substrate were prepared using the sol–gel method. The average grain size <R> and specific surface area Ss were obtained by GISAXS. <R> varied with between the two types of samples from 5.70–6.56 nm. Also, Ss of both these films varied from 0.03×107 to 0.94×107 cm−1. WAXS at three tilting angles has shown differences between the two samples of CeO2.
Keywords
CeO2 , Average grain size , Surface area , Grazing-incidence small-angle X-ray scattering , WAXS
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1999
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2133831
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