Title of article
Coherent X-ray imaging investigation of macrodefects and micropipes on SiC
Author/Authors
Milita، نويسنده , , S and Madar، نويسنده , , R and Baruchel، نويسنده , , J and Anikin، نويسنده , , J.H. and Argunova، نويسنده , , T، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
63
To page
67
Abstract
We describe an X-ray phase imaging technique able to detect micro and macrodefects on SiC. This technique enables investigation of thick samples, not accessible to light transmission microscopy and provides additional information on the defects.
Keywords
Defects on SiC , X-ray phase image
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1999
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2134058
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