Title of article
New results in sublimation growth of the SiC epilayers
Author/Authors
Savkina، نويسنده , , N.S. and Lebedev، نويسنده , , A.A. and Davydov، نويسنده , , D.V. and Strel’chuk، نويسنده , , A.M. and Tregubova، نويسنده , , A.S. and Yagovkina، نويسنده , , M.A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
3
From page
165
To page
167
Abstract
In this work it has been shown that an optimized technology of sublimation epitaxial growth can be used to obtain structural perfection layers with concentration of uncompensated donors NdNa∼1×1015 cm−3 and the hole diffusion length of ∼2.5 μm.
Keywords
sublimation growth , Concentration , 6H?SiC , diffusion length
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1999
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2134081
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