Title of article :
Simulating Si multiple tunnel junctions from pinch-off to ohmic conductance
Author/Authors :
Müller، نويسنده , , Heinz-Olaf and Williams، نويسنده , , David A and Mizuta، نويسنده , , Hiroshi and Durrani، نويسنده , , Zahid A.K Durrani، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
4
From page :
36
To page :
39
Abstract :
Due to their compatibility with CMOS, multiple tunnel junctions (MTJs) are giving rise to an increasing interest in Coulomb blockade silicon devices, along with a higher demand for simulation. Whereas the operating principle has been known for a number of years, here we present new simulation results on MTJs, including geometric island size and island separation. Application of MTJ in a memory cell is discussed.
Keywords :
Simulation , Si multiple tunnel junctions , Pinch-off , Ohmic conductance
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2000
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2135321
Link To Document :
بازگشت