Title of article :
Localized states at GaN surfaces, Schottky barriers, and quantum well interfaces
Author/Authors :
Brillson، نويسنده , , L.J. and Young، نويسنده , , A.P and Levin، نويسنده , , T.M and Jessen، نويسنده , , G.H and Schنfer، نويسنده , , J and Yang، نويسنده , , Y and Xu، نويسنده , , S.H and Cruguel، نويسنده , , H and Lapeyre، نويسنده , , G.J and Ponce، نويسنده , , F.A and Naoi، نويسنده , , Y and Tu، نويسنده , , C and McKenzie، نويسنده , , J.D and Abernathy، نويسنده , , C.R، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
218
To page :
223
Abstract :
We have used low energy electron-excited nanoluminescence (LEEN) spectroscopy to probe the localized electronic states at GaN free surfaces, metal–GaN contacts, and GaN/InGaN quantum well interfaces. These depth-resolved measurements reveal the presence of deep electronic states near GaN interfaces whose energies and relative densities depend sensitively on the local chemical structure and growth conditions. The physical properties of these states correlate with mobility variations in thin GaN films grown by molecular beam epitaxy, Fermi level positions at Mg and Al/GaN Schottky barriers, and the appearance of new phases localized near GaN/InGaN/GaN quantum well interfaces. The growth and processing dependence of deep GaN levels highlights new methods to understand and control the fundamental electronic structure of GaN heterointerfaces.
Keywords :
Deep levels , InGaN , GaN , Interface states , cathodoluminescence , Quantum well
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2000
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2135593
Link To Document :
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