Title of article
X-ray study of SrTiO3 thin films in multilayer structures
Author/Authors
Petrov، نويسنده , , P.K and Ivanov، نويسنده , , Z.G and Gevorgyan، نويسنده , , S.S، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
4
From page
231
To page
234
Abstract
A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples ω- and φ-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers.
Keywords
High-temperature superconducting (HTS) layers , X-Ray , SrTiO3 , Multilayers , Grazing incidence diffraction , strain
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2000
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2136167
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