Microwave dielectric properties of Y2BaCuO5 compound substituted Ni for Cu

The microwave dielectric properties of Y2Ba(Cu1−xNix)O5 solid solutions were studied in order to evaluate the possibility of the existence of a new microwave material within this system. From X-ray powder diffraction (XRPD) analysis, it was determined that Y2Ba(Cu1−xNix)O5 system consists of single phase solid solution in the composition range from 0 to 0.85 Ni. Considerably, the microwave dielectric properties obtained in this study show that the Q.Ef values are improved when compared with those of the solid solutions in the Y2BaCuO5 system.