Author/Authors :
Martin، نويسنده , , Pilar and Landesman، نويسنده , , Jean-Pierre and Bisaro، نويسنده , , Renato and Martin، نويسنده , , Esther and Fily، نويسنده , , Arnaud and Hirtz، نويسنده , , Jean Pierre، نويسنده ,
Abstract :
The microphotoluminescence (μ-PL) technique is proposed for mapping local stress distribution in GaAs/AlGaAs high power laser diode arrays (LDAs). This technique will be used to monitor the stresses that can be induced on the bars during the packaging process. We show herein that also a detailed study of the stress profiles that could exist in the bars before mounting and after aging can be achieved with this technique.
