Title of article :
Microstructure of rapidly solidified Al–20Si alloy powders
Author/Authors :
Kim، نويسنده , , Taek-Soo and Lee، نويسنده , , Byong-Taek and Lee، نويسنده , , Chul Ro and Chun، نويسنده , , Byong-Sun، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
617
To page :
620
Abstract :
Microstructural details of rapidly solidified Al–20Si alloy powders by gas atomization were examined by transmission electron microscope. The as-atomized alloy powder consists of primary and eutectic Si embedded in Al matrix. Typical sizes of Al grain, primary Si and eutectic Si measured in the powder of 40 μm in diameter are 1 μm, 3 μm and 100 nm, respectively. Twin and stacking faults were found to present in the precipitated Si. The alloy powder has semicoherently bonded interface between Al {1 1 1} and Si {1 1 1} with a specific lattice spacing.
Keywords :
Crystallographic orientation , Hypereutectic Al–Si alloys , Rapid solidification
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
2001
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2136821
Link To Document :
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