Author/Authors :
Kim، نويسنده , , Taek and Martin، نويسنده , , R.W. and Watson، نويسنده , , I.M. and Dawson، نويسنده , , M.D. and Krauss، نويسنده , , T.F. and Marsh، نويسنده , , J.H. and De La Rue، نويسنده , , R.M.، نويسنده ,
Abstract :
The performance of GaN-based surface-emitting lasers may be greatly improved by the use of highly-reflecting SiO2/ZrO2 multilayers for both cavity mirrors. We consider some of the limitations of GaN/Al(Ga)N multilayer mirrors and discuss alternative routes for incorporating dielectric multilayers within InGaN/GaN quantum well surface-emitting devices, using lateral epitaxial overgrowth. The use of lateral overgrowth techniques promise the benefit of reduced dislocation densities within the active region. The use of single layer lift-off techniques for the fabrication of patterned mirror templates suitable for overgrowth on GaN-on-sapphire is described.
Keywords :
Nitride semiconductors , VCSELs , microcavities , Oxide mirrors