Title of article
A new approach to preparing tips for atom probe field ion microscopy from powder materials
Author/Authors
Wu، نويسنده , , Fang and Bellon، نويسنده , , P and Lau، نويسنده , , M.L and Lavernia، نويسنده , , E.J and Lusby، نويسنده , , T.A and Melmed، نويسنده , , A.J، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
20
To page
23
Abstract
A new approach to preparing tips for atom probe field ion microscopy from powder materials is described. It is especially useful for particle sizes exceeding >0.050 mm. Particles resulting from mechanical alloying of Cu and Ag, and from cryomilling of conventional Ni powders have been prepared this way for field ion imaging and atom probe composition analysis. In both cases, useful information complementing results from transmission electron microscopy and X-ray diffraction was obtained.
Keywords
ball milling , Atom probe , Cu–Ag , nanocomposites
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2002
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2137464
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