Title of article
Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films
Author/Authors
Posedel، نويسنده , , D and Turkovi?، نويسنده , , A and Dub?ek، نويسنده , , P and Crnjak-Orel، نويسنده , , Z، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
9
From page
154
To page
162
Abstract
Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol–gel dip-coating process. Layer structure in all V/Ce oxides was revealed by grazing-incidence X-ray reflectivity method. The average grain radius 〈R〉, obtained by grazing-incidence small-angle X-ray scattering was correlated with layer thickness.
Keywords
Grazing-incidence small-angle X-ray scattering , V/Ce oxide , Thin films , Grazing-incidence X-ray reflectivity , dip-coating
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2002
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2138041
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