Title of article :
Grazing-incidence X-ray reflectivity on nanosized vanadium oxide and V/Ce oxide films
Author/Authors :
Posedel، نويسنده , , D and Turkovi?، نويسنده , , A and Dub?ek، نويسنده , , P and Crnjak-Orel، نويسنده , , Z، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol–gel dip-coating process. Layer structure in all V/Ce oxides was revealed by grazing-incidence X-ray reflectivity method. The average grain radius 〈R〉, obtained by grazing-incidence small-angle X-ray scattering was correlated with layer thickness.
Keywords :
Grazing-incidence small-angle X-ray scattering , V/Ce oxide , Thin films , Grazing-incidence X-ray reflectivity , dip-coating
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
