Title of article :
The impact of defects to minority-carrier dynamics in heavily doped GaAs:C analyzed by transient photoluminescence spectroscopy
Author/Authors :
Tomm، نويسنده , , J.W. and Maaكdorf، نويسنده , , A. and Mazur، نويسنده , , Y.I. and Gramlich، نويسنده , , S. and Richter، نويسنده , , E. J. Brunner، نويسنده , , F. and Weyers، نويسنده , , M. and Trنnkle، نويسنده , , G. and Malyarchuk، نويسنده , , V. and Günther، نويسنده , , T. and Lienau، نويسنده , , Ch. and Jurisch، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
4
From page :
25
To page :
28
Abstract :
We report photoluminescence decay time measurements in heavily Carbon-doped GaAs epilayers which are designed for the application in heterojunction bipolar transistors. These data provide access to carrier lifetimes that determine the current gains, i.e. amplification of the devices. At room-temperature trapping of non-equilibrium carriers into deep levels may govern the recombination behavior, particularly for low excitation levels. Experimental conditions are determined that allow both to achieve trap saturation and to avoid stimulated emission. Detection must be limited to a spectral window well above the energy gap. Our time-resolved data are explained by intrinsic Auger and radiative recombination mechanisms as well as defect-related recombination and trapping.
Keywords :
Epitaxy of thin films , Gallium arsenide , carbon , Photoluminescence , semiconductor device , doping effects
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2002
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2138074
Link To Document :
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