Below-gap recombination dynamics in GaN revealed by time-resolved and two-wavelength excited photoluminescence

In continuation to the steady state detection of below-gap states by combining a below-gap excitation (BGE) light with an above-gap excitation (AGE) light, we have studied the time-response of both donor-acceptor pair luminescence (DAP) and yellow luminescence (YL) in undoped GaN after switching off the BGE light. An extremely slow recovery of YL with a time constant of up to 28 s was observed, which is interpreted as a relaxation process of electrons from a below-gap state chosen by a BGE energy of 1.17 eV. Trap parameters were quantitatively determined by studying the intensity change and subsequent recovery time of DAP as a function of AGE and BGE power densities. The BGE energy dependence of the intensity change and subsequent recovery time of DAP and YL implies an energy distribution of traps in the band-gap of GaN. The combination of time-resolved PL measurement under two-wavelength excitation scheme was shown to be powerful for understanding the carrier recombination dynamics including YL among below-gap states.