Title of article :
Photoluminescence study of erbium doped SiO2 thin films containing Si nanocrystals
Author/Authors :
Kao، نويسنده , , C.-C and Barthou، نويسنده , , C and Gallas، نويسنده , , B and Fisson، نويسنده , , S and Vuye، نويسنده , , G and Rivory، نويسنده , , J، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
4
From page :
226
To page :
229
Abstract :
This study is focused on the photoluminescence (PL) of SiO2 films containing nanometer-size Si crystals (nc-Si) and Er3+ ions. The correlation between the intensities of the two PL bands related to nc-Si and Er is investigated as a function of pump power and pump wavelength. The existence of energy transfer from nc-Si to Er3+ ions is verified.
Keywords :
nc-Si , ER , energy transfer , Photoluminescence
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2003
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2140034
Link To Document :
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