Title of article
Photoluminescence study of erbium doped SiO2 thin films containing Si nanocrystals
Author/Authors
Kao، نويسنده , , C.-C and Barthou، نويسنده , , C and Gallas، نويسنده , , B and Fisson، نويسنده , , S and Vuye، نويسنده , , G and Rivory، نويسنده , , J، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
4
From page
226
To page
229
Abstract
This study is focused on the photoluminescence (PL) of SiO2 films containing nanometer-size Si crystals (nc-Si) and Er3+ ions. The correlation between the intensities of the two PL bands related to nc-Si and Er is investigated as a function of pump power and pump wavelength. The existence of energy transfer from nc-Si to Er3+ ions is verified.
Keywords
nc-Si , ER , energy transfer , Photoluminescence
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2003
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2140034
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