Title of article :
Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films
Author/Authors :
Tanaka، نويسنده , , Nobuo and Kawahara، نويسنده , , Michiharu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
25
To page :
30
Abstract :
Metal mediated crystallization of amorphous germanium (a-Ge) films was studied through ‘in-situ’ heating by time-resolved high-resolution transmission electron microscopy (HRTEM) and high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), mainly on a-Ge films with nanometer-sized gold clusters on the surfaces. It was revealed from the dynamic HRTEM observations that the interface between crystalline gold and a-Ge was a bit melted due to alloying even at 70°C and liquid-like gold-rich alloys migrate on the a-Ge films to initiate the crystallization, which was confirmed also through the static observations with HAADF-STEM.
Keywords :
Fractal patterns , Melted gold clusters , High-angle annular dark field scanning transmission electron microscopy. , Amorphous germanium films , Metal-mediated crystallization , Time-resolved high-resolution transmission electron microscopy
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
2001
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2140071
Link To Document :
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