Title of article
Microstructural study of BaTiO3/SrTiO3 superlattice
Author/Authors
Tong، نويسنده , , F.Q. and Yu، نويسنده , , W.X. and Liu، نويسنده , , F. and Zuo، نويسنده , , Y. and Ge، نويسنده , , X.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
4
From page
6
To page
9
Abstract
The microstructure of BaTiO3 (BTO)/SrTiO3 (STO) superlattice grown on (001) STO substrate by laser molecular beam epitaxy (L-MBE) was investigated. The microstructural parameters of BTO/STO superlattice, such as the total film thickness, superlattice period, surface and interface root-mean-square (rms) roughness were obtained by computer simulation of the small-angle X-ray diffraction spectra. The results show that the interfaces and surface of the superlattice are very smooth; their rms roughness is about 2 Å. The experimental examination of atomic force microscopy has proved the smoothness of the surface of the superlattice. There exists a little correlation along 〈001〉 direction of the surperlattice. The growth mechanism of the superlattice is discussed. By modified Braggʹs law, the total thickness of the superlattice is calculated, and is consistent with that of the simulation of small-angle X-ray reflectivity.
Keywords
Small-angle X-ray diffraction , microstructure , Interface and surface , RMS roughness , BaTiO3/SrTiO3 superlattice
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2003
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2140171
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