Growth and characterization of PNZST thin films

We have grown and compared microstructures and dielectric properties of PNZST thin films prepared on two different substrates by sol–gel methods. To ensure a complete single-phase perovskite PNZST thin film, a capping layer of PbO must be added to the top surface of the thin film before final heat treatment. Microstructure characterization was examined with X-ray diffraction, scanning and transmission electron microscopy. Dielectric and antiferroelectric properties were investigated as a function of temperature.