Growth of Nd2O3 buffer layers on Ni tapes by reel-to-reel sol–gel process for YBCO coated conductors

In this study, Nd2O3 buffer layers were deposited on textured Ni tapes using a reel-to-reel sol–gel process for YBa2Cu3O7−x (YBCO) coated conductors. Depending on processing temperature, phase transformation in Nd2O3 thin films was investigated. An Nd based precursor solution was prepared using solvent, chelating agents and modifying liquid material. The amorphous gel films were dried at 300 °C for 30 s and then heat treated at 500 °C for 2 min in air in the reel-to-reel sol–gel set up with three-zones furnace. The calcined films were annealed at temperature range of 850 and 1150 °C for 10–30 min under two different atmospheres. It was found that cubic phase transformed to hexagonal structure up to 1000 °C. The textured films were grown onto the textured Ni tapes at 1150 °C for 10 min under 4% H2–Ar gas flow using modifying triethanol amin. ESEM images of Nd2O3 buffer layer showed crack-free, pinhole-free, dense and smooth microstructure.