Atomic force microscopy assessment of mechanically induced scratch damage in polypropylenes and ethylene–propylene di-block copolymers

Atomic force microscopy (AFM) in tapping mode has been used to determine the extent of surface damage induced during a scratch test in different grades of polypropylenes (PPs) and ethylene–propylene (EP) di-block copolymers. The surface damage is examined for long chain polymeric materials and their respective short chains. The extent of surface damage is evaluated in terms of average surface height of the plastically deformed region, depth of the scratch tracks, and thickness and density of the scratch tracks. The ability of the polymeric materials to resist scratch deformation under identical conditions of scratch test follows the sequence (from maximum resistance to minimum resistance): high crystallinity PPs>low crystallinity PPs>EP di-block copolymers. Also, short chain polymeric materials have greater resistance to scratch deformation than their respective long chain polymers. The scratch tracks are zigzag in PPs and parabolic in EP di-block copolymers with localized plastic flow involving voids. It is interpreted that modulus and yield strength are the determining factors that dictate the scratch resistance of polymeric materials.