• Title of article

    Effect of peak load on the determination of hardness and Youngʹs modulus of hot-pressed Si3N4 by nanoindentation

  • Author/Authors

    Gong، نويسنده , , Jianghong and Miao، نويسنده , , Hezhuo and Peng، نويسنده , , Zhijian and Qi، نويسنده , , Longhao، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    6
  • From page
    140
  • To page
    145
  • Abstract
    The indentation load–displacement curves of a hot-pressed silicon nitride were measured under different peak load levels. The unloading segments of these curves were analyzed using the widely adopted Oliver–Pharr method. It was found that both the hardness, H, and the Youngʹs modulus, E, exhibit significant peak-load-dependence. Empirical approaches were then proposed to determine the load-independent hardness and modulus. The hardness and modulus deduced from these empirical approaches were proven to be comparable with the literature reported data measured with conventional methods.
  • Keywords
    Nano-indentation , ceramics , Silicon nitride , Hardness , Youngיs modulus
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Serial Year
    2003
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Record number

    2142280