Title of article :
Quantitative descriptions of periodic layer formation during solid state reactions
Author/Authors :
Chen، نويسنده , , Y.C. and Zhang، نويسنده , , Y.G. and Chen، نويسنده , , C.Q.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Periodic layer formation during solid state reactions is related to the stresses induced by the difference in interface growth rate of the two phases within the layer. When the elastic deformation of the slow-growing phase reaches its elastic maximum, it would be split up from the reaction front and the layer separating occurs. Theoretical model describes systematically the patterns formed in various systems and explains almost all of the experimental facts. It also predicts that the reactive diffusion system Zn/Co2Si should be interface controlled and system Zn/Fe3Si be mixed-controlled.
Keywords :
Interface control , Diffusion-induced stresses , pattern formation , Periodic layer formation , Theory and modeling
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Journal title :
MATERIALS SCIENCE & ENGINEERING: A