• Title of article

    Low temperature properties of PI/SiO2 nanocomposite films

  • Author/Authors

    Wang، نويسنده , , Z.D. and Lu، نويسنده , , J.J. and Li، نويسنده , , Y. and Fu، نويسنده , , S.Y. and Jiang، نويسنده , , S.Q. and Zhao، نويسنده , , X.X.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    6
  • From page
    216
  • To page
    221
  • Abstract
    In this paper, the mechanical properties of PI/SiO2 nanocomposite hybrid films with different silica doping levels are experimentally studied at low temperature. Experimental results show that the coefficient of thermal expansion (CTE) of the PI/SiO2 nanocomposite hybrid films gradually reduces when the ambiance temperature is decreased. At the liquid nitrogen temperature (77 K), the CTE value is about five times less than that at room temperature (287 K). The measured CTEs of hybrid films greatly decrease when doped with inorganic silica, especially when the silica doping level is more than 1 wt.%. However, too high silica contents (more than 10 wt.%) can cause problem to disperse effectively and the specimens become quite opaque. Experimental results also show that the effects of the pre-applied stress levels can be neglected on the CTE testing. When the ambient temperature changes from 287 to 77 K, the measured average values of the films’ ultimate tensile strength (UTS) and Youngʹs modulus increase about 60 and 90%, respectively, while the breaking elongation decreases about 42%.
  • Keywords
    Coefficient of thermal expansion (CTE) , low temperature , mechanical properties , Film
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    2005
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2143134