Title of article :
Engineered substrates and their future role in microelectronics
Author/Authors :
Fitzgerald، نويسنده , , Eugene A.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
8
From page :
8
To page :
15
Abstract :
Progress in lattice engineering, planar ultra-strained epitaxial layer growth, and layer transfer technology has resulted in the ability to create many engineered substrate types. In particular, a wealth of possibilities exists in the SiGe/Si system. Engineered substrates based on relaxed SiGe layers on Si with strained Si and Ge layers have resulted in long channel MOSFETs with ∼2× enhancement in NMOS drive current and more than 10× enhancement in PMOS drive current as compared to control Si MOSFETs. We have attempted to increase the NMOS drive current further by beginning to explore strained GaAs on relaxed SiGe layers on Si.
Keywords :
MOSFET , Lattice engineering , Si and Ge layers
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2005
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2143161
Link To Document :
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