Title of article :
A comparative study of Co thin film deposited on GaAs (1 0 0) and glass substrates
Author/Authors :
Sharma، نويسنده , , A. and Brajpuriya، نويسنده , , R. and Tripathi، نويسنده , , S. and Jain، نويسنده , , D. and Dubey، نويسنده , , R. and Shripathi، نويسنده , , T. and Chaudhari، نويسنده , , S.M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
6
From page :
120
To page :
125
Abstract :
The structural, magnetic and transport properties of Co/GaAs (1 0 0) and Co/glass thin films have been investigated. The structural measurements reveal the crystalline nature of Co thin film grown on GaAs, while microcrystalline nature in case of glass substrate. The film grown on GaAs shows higher coercivity (49.0 G), lower saturation magnetization (3.65 × 10−4) and resistivity (8 μΩ cm) values as compared to that on glass substrate (22 G, 4.77 × 10−4 and 18 μΩ cm). The grazing incidence X-ray reflectivity and photoemission spectroscopy results show the interaction between Co and GaAs at the interface, while the Co layer grown on glass remains unaffected. These observed results are discussed and interpreted in terms of different growth morphologies and structures of as grown Co thin film on both substrates.
Keywords :
Co thin film , XRD , GIXRR , VSM , AFM , PES
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2006
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2144129
Link To Document :
بازگشت