Title of article
Solution processed pentacene thin films and their structural properties
Author/Authors
Tao، نويسنده , , Chunlan and Zhang، نويسنده , , Xuhui and Zhang، نويسنده , , Fu-Jia and Liu، نويسنده , , Yi-Yang and Zhang، نويسنده , , Hao-Li، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
4
From page
1
To page
4
Abstract
The paper reported the solution process of pentacene thin films from organic solvent O-dichlorobenzene. The pentacene thin films obtained from different conditions were characterized by X-ray diffraction (XRD), optical microscopy, scanning electron microscopy (SEM), and UV–vis spectroscopy. The result shows that the pentacene solution was successfully obtained at a minimum temperature of 40 °C. The optimum temperature of forming pentacene thin films was 100 °C.
Keywords
SEM , Solution processing , Thin films , characterization , pentacene , XRD , AFM
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2007
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2145388
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