Title of article :
Solution processed pentacene thin films and their structural properties
Author/Authors :
Tao، نويسنده , , Chunlan and Zhang، نويسنده , , Xuhui and Zhang، نويسنده , , Fu-Jia and Liu، نويسنده , , Yi-Yang and Zhang، نويسنده , , Hao-Li، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
4
From page :
1
To page :
4
Abstract :
The paper reported the solution process of pentacene thin films from organic solvent O-dichlorobenzene. The pentacene thin films obtained from different conditions were characterized by X-ray diffraction (XRD), optical microscopy, scanning electron microscopy (SEM), and UV–vis spectroscopy. The result shows that the pentacene solution was successfully obtained at a minimum temperature of 40 °C. The optimum temperature of forming pentacene thin films was 100 °C.
Keywords :
SEM , Solution processing , Thin films , characterization , pentacene , XRD , AFM
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2007
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2145388
Link To Document :
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