Structural and physical property of A-site ordered perovskite manganite LaBaMn2O6 thin film on SrTiO3(0 0 1)

An A-site ordered perovskite manganite LaBaMn2O6−δ (δ ≅ 0.5) film was fabricated by means of an excimer laser assisted metal organic deposition (ELAMOD) method and epitaxially grown on a SrTiO3(0 0 1) substrate. The LaBaMn2O6−δ film was crystallized in [0 1 0]- and [0 0 1]-oriented domains that were confirmed by X-ray diffraction. The A-site ordered structure formed at 500 °C under KrF laser irradiation at a laser fluence of 140 mJ/cm2 for 60 min in an Ar flow. A LaBaMn2O6 film was obtained by oxygen annealing of the as-prepared LaBaMn2O6−δ film at 500 °C for 3 h. The magnetization for the LaBaMn2O6−δ film showed a ferromagnetic transition at 330 K, and the electrical resistivity exhibited a semiconductor-metal transition at 330 K. The magnetoresistance (MR) effect was observed below 370 K, and the MR efficiency was up to 135% at 300 K under 9 T. The ELAMOD process is expected to serve as a new key technique for the fabrication of A-site ordered perovskite manganite thin films.