Title of article
Epitaxial insulator for bottom-gate field-effect devices based on TiO2
Author/Authors
Katayama، نويسنده , , Masao and Koinuma، نويسنده , , Hideomi and Matsumoto، نويسنده , , Yuji، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
3
From page
19
To page
21
Abstract
Field-effect devices with bottom-gate structure based on anatase TiO2 active channels were fabricated. The key factor to achieve this was the quality of epitaxial insulator layers, viz.; the insulating property and their crystallinity, because they work not only as a well insulator for field-effect devices but also as a template for the subsequent growth of epitaxial active layers. Our devices showed typical transistor actions. On-to-off current ratio exceeded 104 and the field effect mobility of 0.04 cm2/V s were obtained. Interestingly, the device characteristics were found to be sensitive to ambient and light, suggesting their potential for manipulating the fruitful TiO2 surface functions by tuning the gate voltage.
Keywords
Electric field effect , Epitaxy of thin film , Titanium dioxide
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2008
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2145673
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