• Title of article

    An experimentally consistent atomistic structural model of silica glass

  • Author/Authors

    Bowron، نويسنده , , D.T.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    5
  • From page
    166
  • To page
    170
  • Abstract
    Empirical potential structure refinement is used to build an atomistic model of silica glass based on neutron scattering data. This model is tested against X-ray diffraction and extended X-ray absorption fine structure (EXAFS) spectroscopy data to establish its local and intermediate range structural veracity. The chemical specificity of the silicon and oxygen K-edge spectroscopic information allows us to confirm that the neutron scattering derived model represents a reasonable representation of the three partial structure factors that are required to characterise this binary glass and subsequently give confidence in the Faber–Ziman and Bhatia–Thornton partial structure factors and pair distribution functions that are extracted from the model.
  • Keywords
    glass structure , neutron scattering , EXAFS , X-Ray scattering , EPSR
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    2008
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2145760