Title of article
An experimentally consistent atomistic structural model of silica glass
Author/Authors
Bowron، نويسنده , , D.T.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
166
To page
170
Abstract
Empirical potential structure refinement is used to build an atomistic model of silica glass based on neutron scattering data. This model is tested against X-ray diffraction and extended X-ray absorption fine structure (EXAFS) spectroscopy data to establish its local and intermediate range structural veracity. The chemical specificity of the silicon and oxygen K-edge spectroscopic information allows us to confirm that the neutron scattering derived model represents a reasonable representation of the three partial structure factors that are required to characterise this binary glass and subsequently give confidence in the Faber–Ziman and Bhatia–Thornton partial structure factors and pair distribution functions that are extracted from the model.
Keywords
glass structure , neutron scattering , EXAFS , X-Ray scattering , EPSR
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2008
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2145760
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