Title of article :
An experimentally consistent atomistic structural model of silica glass
Author/Authors :
Bowron، نويسنده , , D.T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
166
To page :
170
Abstract :
Empirical potential structure refinement is used to build an atomistic model of silica glass based on neutron scattering data. This model is tested against X-ray diffraction and extended X-ray absorption fine structure (EXAFS) spectroscopy data to establish its local and intermediate range structural veracity. The chemical specificity of the silicon and oxygen K-edge spectroscopic information allows us to confirm that the neutron scattering derived model represents a reasonable representation of the three partial structure factors that are required to characterise this binary glass and subsequently give confidence in the Faber–Ziman and Bhatia–Thornton partial structure factors and pair distribution functions that are extracted from the model.
Keywords :
glass structure , neutron scattering , EXAFS , X-Ray scattering , EPSR
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2008
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2145760
Link To Document :
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