Imaging thin and ultrathin organic films by scanning white light interferometry

We present the results of a feasibility study of the capabilities of scanning white light interferometry (SWLI) to map large (macroscopic) areas of thin and ultrathin organic films deposited on mica and borosilicate glass substrates. We have shown that SWLI can provide useful characteristics (such as thickness and homogeneity) of polymer monolayers and surface patterns prepared by microcontact printing. We present the principle of operation of the technique and discuss the conditions under which SWLI can give reliable results, its strengths and its limitations.