Texture evolution during grain growth in recrystallized commercially pure titanium

The evolutions of microstructure and crystallographic texture in low-alloyed titanium sheets are investigated by electron backscattering diffraction at different grain growth stages. Recrystallization of 80% cold-rolled sheets and subsequent grain growth lead to equiaxed microstructures. The texture obtained at the end of primary recrystallization is very close to that of the cold-rolled state, with the maximum value of the orientation distribution function at {0°, 35°, 0°}. The orientations developing during grain growth correspond to a broad peak centered around {0°, 35°, 30°} which is a minor component in the initial texture. The disappearing orientations are widely scattered throughout orientation space and present two major disadvantages in the growth competition: (i) they are highly misoriented with respect to the growing texture component and (ii) the grains having these orientations belong to the smallest size range in the microstructure obtained at the end of the primary recrystallization. The grain boundaries remaining after extended grain growth are characterized by an increasing proportion of misorientations below 30° and random rotation axes.