Dynamic recrystallization in Al-single crystals revealed by synchrotron radiation Laue technique

An experimental study on the microstructure development and stress–strain behavior during high temperature deformation of aluminum (Al) single crystals was made by using the synchrotron radiation Laue technique and the electron backscatter pattern technique. The main purpose was to clarify the process of dynamic recrystallization (DRX). The measured stress–strain curves with large stress peaks and the in situ observed new Laue spots without streaks at around the stress peaks confirmed the occurrence of DRX. Crystallographic analysis shows that the common axis between the DRX grain and the matrix is close to 〈1 1 2〉. The unrecrystallized region near the DRX grain consists of subgrains adjoined each other with 〈1 1 2〉 tilt boundaries and the size of subgrains becomes smaller and the misfit at subgrain boundaries becomes larger as the DRX grain boundaries are approached. These experimental results suggest that DRX grains are nucleated through the development of subgrains.