Author/Authors :
Zi، نويسنده , , Zhenfa and Lei، نويسنده , , Hechang and Zhu، نويسنده , , Xiangde and Wang، نويسنده , , Bo and Zhang، نويسنده , , Shoubao and Zhu، نويسنده , , Xuebin and Song، نويسنده , , Wenhai and Sun، نويسنده , , Yuping، نويسنده ,
Abstract :
Nickel–zinc (Ni–Zn) ferrite Ni0.7Zn0.3Fe2O4 thin films were fabricated on Si(0 0 1) substrate by a simple chemical method. The microstructure and magnetic properties were systematically investigated. X-ray diffraction results show that all samples have a single-phase spinel structure with the space group of F d 3 ¯ m . The results of field-emission scanning electronic microscopy show that the mean grain size increases from 10 to 32 nm with increasing the annealing temperature from 500 to 900 °C. The magnetic properties of Ni0.7Zn0.3Fe2O4 ferrite thin films exhibit a strong dependence on the annealing temperature. The coercivity increases from 25 to 80 Oe and the saturation magnetization increases from 146 to 283 emu/cm3 with increasing the annealing temperature, which is in favor of modern electronic device miniaturization.
