Title of article
Thickness dependence of transformation characteristics of Ni–Mn–Ga thin films deposited on alumina: Experiment and modeling
Author/Authors
Chernenko، نويسنده , , V.A. and Kohl، نويسنده , , M. and Ohtsuka، نويسنده , , M. and Takagi، نويسنده , , T. and L’vov، نويسنده , , V.A. and Kniazkyi، نويسنده , , V.M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
944
To page
947
Abstract
A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni–Mn–Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.
Keywords
Alumina substrate , Martensitic transformation temperatures , MODELING , resistivity , Ni–Mn–Ga thin films
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2006
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2148281
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