Title of article
Application of ion scattering techniques to characterize polymer surfaces and interfaces
Author/Authors
Composto، نويسنده , , Russell J. and Walters، نويسنده , , Russel M. and Genzer، نويسنده , , Jan، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
74
From page
107
To page
180
Abstract
Ion beam analysis techniques, particularly elastic recoil detection (ERD) also known as forward recoil spectrometry (Frcs) has proven to be a value tool to investigate polymer surfaces and interfaces. A review of ERD, related techniques and their impact on the field of polymer science is presented. The physics of the technique is described as well as the underlying principles of the interaction of ions with matter. Methods for optimization of ERD for polymer systems are also introduced, specifically techniques to improve the depth resolution and sensitivity. Details of the experimental setup and requirements are also laid out. After a discussion of ERD, strategies for the subsequent data analysis are described. The review ends with the breakthroughs in polymer science that ERD enabled in polymer diffusion, surfaces, interfaces, critical phenomena, and polymer modification.
Keywords
Polymer surface , ion scattering , Polymer interface , Elastic recoil detection , depth profiling , Forward recoil spectrometry
Journal title
Materials Science and Engineering R Reports
Serial Year
2002
Journal title
Materials Science and Engineering R Reports
Record number
2152464
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